![[IEEE IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Dayton, OH, USA (20-23 May 1996)] Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Scanning radiometric imager (SRI)]()
[IEEE IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Dayton, OH, USA (20-23 May 1996)] Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996 - Scanning radiometric imager (SRI)Milligan, S.A.; Parker, J.H.; DeLong, M.L. · 1996