![[IEEE Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Napa Valley, CA, USA (Nov. 30-Dec. 2, 2005)] Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Formal meaning of coverage metrics in simulation-based hardware design verification]()
[IEEE Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Napa Valley, CA, USA (Nov. 30-Dec. 2, 2005)] Tenth IEEE International High-Level Design Validation and Test Workshop, 2005. - Formal meaning of coverage metrics in simulation-based hardware design verificationUgarte, I.; Sanchez, P. · 2005