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Device for testing high-precision hole gauges with scale factors of 0.001 and 0.002 mm

Device for testing high-precision hole gauges with scale factors of 0.001 and 0.002 mm

é. P. Yanushkevich

作者é. P. Yanushkevich
卷第8卷
期第2期
印刷ISSN0543-1972
电子ISSN1573-8906
文件大小101.45KB
发表时间1965-02
DOI10.1007/bf00982831
页码135-136

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