LES TOUNG-HOU
- 期刊名称Central Asiatic Journal
- 作者JOS. L. M. MULLIE
- 卷第12卷
- 期第4期
- 印刷ISSN0008-9192
- 文件大小666.36KB
- 发表时间1969
- DOI10.2307/41926790
- 页码241-249
Birefringent channel waveguides defined by impurity-induced superlattice disorderingE. Kapon; N. G. Stoffel; E. A. Dobisz; R. Bhat · 1988
Reduction and elimination of proximity effectsDobisz, E. A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Control in sub-100 nm lithography in SAL-601E. A. Dobisz · 1997
Nanolithography in polymethylmethacrylate: An atomic force microscope studyE. A. Dobisz · 1998
Optomechanical nanoantenna: far-field control of near-field through mechanical reconfigurationE. M. Campo; E. A. Dobisz; L. A. Eldada; A. Bonakdar; R. L. Brown; S. J. Jang; V. Fathipour; I. Hassani Nia; M. Rezaei; H. Mohseni
Lateral resolution of Si induced disordering of superlatticesDobisz, E. A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1989
Effects of molecular properties on nanolithography in polymethyl methacrylateE. A. Dobisz; S. L. Brandow; R. Bass; J. Mitterender · 2000
Scanning tunneling microscope lithography: A solution to electron scatteringDobisz, E. A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992