![SPIE Proceedings [SPIE 1982 Los Angeles Technical Symposium - Los Angeles (Wednesday 27 January 1982)] Optical Systems Engineering II - <title>Use Of Phase Measuring Interferometry In Quantity Production Of High Quality Optics</title>]()
SPIE Proceedings [SPIE 1982 Los Angeles Technical Symposium - Los Angeles (Wednesday 27 January 1982)] Optical Systems Engineering II - <title>Use Of Phase Measuring Interferometry In Quantity Production Of High Quality Optics</title>Yoder, Jr., P. R.; Grosso, R. P.; Crane, R.; Yoder, Jr., Paul R. · 1982