Lockhart Plot or Dzerhinskii Plot?
- 期刊名称The Journal of Modern History
- 作者Richard K. Debo
- 卷第43卷
- 期第3期
- 印刷ISSN0022-2801
- 电子ISSN1537-5358
- 文件大小623.69KB
- 发表时间1971-09
- DOI10.2307/1878562
- 页码413-439
[IEEE IEEE International. 2005 Proceedings of the IEEE Workload Characterization Symposium, 2005. - Austin, TX, USA (2005.10.6-2005.10.8)] IEEE International. 2005 Proceedings of the IEEE Workload Characterization Symposium, 2005. - Proceedings of the 2005 IEEE International Symposium on Workload Characterization2005
[IEEE Proceedings of the IEEE International Symposium on Industrial Electronics - Dubrovnik, Croatia (2005.6.20-2005.6.23)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Proceedings of the IEEE International Symposium on Industrial Electronics 2005 [ISIE 2005]2005
[IEEE Proceedings of the IEEE International Symposium on Industrial Electronics - Dubrovnik, Croatia (2005.6.20-2005.6.23)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Proceedings of the IEEE International Symposium on Industrial Electronics 2005 [ISIE 2005]2005
[IEEE Proceedings of the IEEE International Symposium on Industrial Electronics - Dubrovnik, Croatia (2005.6.20-2005.6.23)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Proceedings of the IEEE International Symposium on Industrial Electronics 2005 [ISIE 2005]2005
[IEEE Proceedings of the IEEE International Symposium on Industrial Electronics - Dubrovnik, Croatia (2005.6.20-2005.6.23)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Proceedings of the IEEE International Symposium on Industrial Electronics 2005 [ISIE 2005]2005
[IEEE IEEE International. 2005 Proceedings of the IEEE Workload Characterization Symposium, 2005. - Austin, TX, USA (2005.10.6-2005.10.8)] IEEE International. 2005 Proceedings of the IEEE Workload Characterization Symposium, 2005. - IEEE International Symposium on Workload Characterization - Copyright2005
[IEEE Proceedings of the IEEE International Symposium on Industrial Electronics - Dubrovnik, Croatia (2005.6.20-2005.6.23)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - ISIE 2005 - IEEE International Symposium on Industrial Electronics 20052005
[IEEE Proceedings of the IEEE International Symposium on Industrial Electronics - Dubrovnik, Croatia (2005.6.20-2005.6.23)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - ISIE 2005 - IEEE International Symposium on Industrial Electronics 20052005