A progress report on international standardization in the field of electronic reliability : R. Brewer, IEE Conf. Reliab. Electron., Conf. Publ. No. 60, 10–12 December (1969), p. 70

• 卷第9卷
• 期第5期
• 印刷ISSN0026-2714
• 文件大小107.33KB
• 发表时间1970
• DOI10.1016/0026-2714(70)90335-5