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Discriminability of differences in line slope and in line arrangement as a function of mask delay

Discriminability of differences in line slope and in line arrangement as a function of mask delay

Jacob Beck; Bruce Ambler
  • 作者Jacob Beck; Bruce Ambler
  • 卷第12卷
  • 期第1期
  • 印刷ISSN0031-5117
  • 电子ISSN1532-5962
  • 文件大小850.84KB
  • 发表时间1972-01
  • DOI10.3758/bf03212838
  • 页码33-38
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