A method for fitting the Fuchs-Sondheimer theory to resistivity-thickness measurements for all film thicknesses
- 作者G.N. Gould; L.A. Moraga
- 卷第10卷
- 期第2期
- 印刷ISSN0040-6090
- 文件大小211.66KB
- 发表时间1972
- DOI10.1016/0040-6090(72)90202-7
- 页码327-330
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