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Thermally stimulated current measurements applied to silver-doped silicon†

Thermally stimulated current measurements applied to silver-doped silicon†

SMITH, P. C.; MILNES, A. G.

期刊名称International Journal of Electronics
作者SMITH, P. C.; MILNES, A. G.
卷第32卷
期第6期
印刷ISSN0020-7217
电子ISSN1362-3060
文件大小417.31KB
发表时间1972-06
DOI10.1080/00207217208938333
页码697-709

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