Dielectric breakdown induced by sodium in MOS structures
- 期刊名称Journal of Applied Physics
- 作者DiStefano, T. H.
- 卷第44卷
- 期第1期
- 印刷ISSN0021-8979
- 文件大小387.53KB
- 发表时间1973
- DOI10.1063/1.1661931
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