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Comparison of backscattering spectrometry and secondary ion mass spectrometry by analysis of tantalum pentoxide layers

Comparison of backscattering spectrometry and secondary ion mass spectrometry by analysis of tantalum pentoxide layers

Chu, W. K.; Nicolet, M. A.; Mayer, J. W.; Evans, C. A.
  • 期刊名称Analytical Chemistry
  • 作者Chu, W. K.; Nicolet, M. A.; Mayer, J. W.; Evans, C. A.
  • 卷第46卷
  • 期第14期
  • 印刷ISSN0003-2700
  • 电子ISSN1520-6882
  • 文件大小698.20KB
  • 发表时间1974-12
  • DOI10.1021/ac60350a039
  • 页码2136-2141
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