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ThresholdHamm, M. E.; Hamm, R. W.; Donahue, J.; Gram, P. A. M.; Pratt, J. C.; Yates, M. A.; Bolton, R. D.; Clark, D. A.; Bryant, H. C.; Frost, C. A.; Smith, W. W. · Physical Review Letters · 1979
photodetachmentBryant, H. C.; Clark, David A.; Butterfield, Kenneth B.; Frost, C. A.; Sharifian, H.; Tootoonchi, H.; Donahue, J. B.; Gram, P. A. M.; Hamm, M. E.; Hamm, R. W.; Pratt, J. C.; Yates, M. A.; Smith, W. W. · Physical Review A · 1983
Photodetachment of Relativistic IonsDonahue, J. B.; Gram, P. A. M.; Hamm, M. E.; Hamm, R. W.; Bryant, H. C.; Butterfield, K. B.; Clark, D. A.; Frost, C. A.; Smith, W. W. · 1981
Time-Resolved Beam Energy Measurements at LAMPFClark, D. A.; Bryant, H. C.; Frost, C. A.; Donahue, J. B.; Hamm, M. E.; Hamm, R. W.; Hudgings, D. W.; McNaughton, M. W.; Pratt, J. C.; Yates-Williams, M. A. · IEEE Transactions on Nuclear Science · 1979
AIP Conference Proceedings [AIP APPLICATIONS OF NUCLEAR TECHNIQUES: Eleventh International Conference - Crete, (Greece) (12–18 June 2011)] - Electrostatic Matching of a High Current Proton Beam to a RFQBecker, R.; Hamm, R. W.; Pearce-Percy, H.; Hamm, Marianne E.; Hamm, Robert W. · 2011
Alignment with exposed resist in photolithographyJ. Burm; A. Tate; R. F. Kopf; R. W. Ryan; R. A. Hamm; L. M. Chirovsky · 1999
BuchbesprechungenR. Zenker; E. Buchborn; Kiese; Riecker; Hamm; D. Michel; R. Kaiser; Burck; Erich Lindner · 1965
United StatesHamm, T. E.; Dell, R. B.; Van Sluyters, R. C. · ILAR Journal · 1995