Applications of a semiconductor backscattered electron detector in a scanning electron microscope
- 期刊名称Journal of Physics E: Scientific Instruments
- 作者Stephen, J; Smith, B J; Marshall, D C; Wittam, E M
- 卷第8卷
- 期第7期
- 印刷ISSN0022-3735
- 文件大小624.59KB
- 发表时间1975-07
- DOI10.1088/0022-3735/8/7/021
- 页码607-610
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