Reliability analysis of intermittently used systems when failures are detected only during a usage period : T. Nakagawa and Y. Sawa and Y. Suzuki. Microelectron. and Reliab.15, 35 (1976)

• 卷第15卷
• 期第4期
• 印刷ISSN0026-2714
• 文件大小117.40KB
• 发表时间1976
• DOI10.1016/0026-2714(76)90422-4