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Determination of intervalley electron-phonon deformation-potential constants in n-silicon by analysis of high-electric-field transport properties

Determination of intervalley electron-phonon deformation-potential constants in n-silicon by analysis of high-electric-field transport properties

Nash, James; Holm-Kennedy, James

作者Nash, James; Holm-Kennedy, James
卷第15卷
期第8期
印刷ISSN1098-0121
电子ISSN1550-235X
文件大小822.27KB
发表时间1977
DOI10.1103/physrevb.15.3994
页码3994-4006

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