Detection of excess crystalline As and Sb in III-V oxide interfaces by Raman scattering
- 期刊名称Applied Physics Letters
- 作者Farrow, Roger L.; Chang, Richard K.; Mroczkowski, Stanley; Pollak, Fred H.
- 卷第31卷
- 期第11期
- 印刷ISSN0003-6951
- 文件大小399.86KB
- 发表时间1977
- DOI10.1063/1.89542
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