Investigation of dislocations by backscattering spectrometry and transmission electron microscopy

• 作者W.F. Tseng; J. Gyulai; T. Koji; S.S. Lau; J. Roth; J.W. Mayer
• 卷第149卷
• 印刷ISSN0029-554X
• 文件大小359.76KB
• 发表时间1978
• DOI10.1016/0029-554x(78)90938-2
• 页码615-617