[IEEE International Automatic Testing Conference AUTOTESTCON '78. - San Diego, CA (Nov. 28-30, 1978)] International Automatic Testing Conference AUTOTESTCON '78. - A review of analog automatic test generation
- 作者Schreiber, H.H.
- 文件大小613.60KB
- 发表时间1978
- DOI10.1109/autest.1978.764226
- 页码1-8
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