[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - Kyoto, Japan (June 16-18, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - A low leakage SRAM macro with replica cell biasing schemeTakeyama, Y.; Otake, H.; Hirabayashi, O.; Kushida, K.; Otsuka, N. · 2005

[IEEE Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - Kyoto, Japan (June 16-18, 2005)] Digest of Technical Papers. 2005 Symposium on VLSI Circuits, 2005. - A low leakage SRAM macro with replica cell biasing schemeTakeyama, Y.; Otake, H.; Hirabayashi, O.; Kushida, K.; Otsuka, N. · 2005