Life Test and Degradation Modes of Continuously Operated NEA GaP Cold-Cathode
Kan, Hirofumi; Nakamura, Tsutomu; Katsuno, Hironobu; Hagino, Minoru; Sukegawa, Tokuzo
- 期刊名称Japanese Journal of Applied Physics
- 作者Kan, Hirofumi; Nakamura, Tsutomu; Katsuno, Hironobu; Hagino, Minoru; Sukegawa, Tokuzo
- 卷第18卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小765.96KB
- 发表时间1979-01-01
- DOI10.7567/JJAPS.18S1.399