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Ionography on thick dielectric sheets: some development artefacts

Ionography on thick dielectric sheets: some development artefacts

W. W. Seelentag; R. A. Fox; R. J. Barish; J. W. Boag
  • 作者W. W. Seelentag; R. A. Fox; R. J. Barish; J. W. Boag
  • 文件大小446.51KB
  • 发表时间1979
  • DOI10.1088/0022-3727/12/5/024
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