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A Simple Procedure for Computing Performance Characteristics of Truncated Sequential Tests with Exponential Lifetimes

A Simple Procedure for Computing Performance Characteristics of Truncated Sequential Tests with Exponential Lifetimes

Peichuen Kao, Edward P. C. Kao and Jack M. Mogg
  • 期刊名称Technometrics
  • 作者Peichuen Kao, Edward P. C. Kao and Jack M. Mogg
  • 卷第21卷
  • 期第2期
  • 印刷ISSN0040-1706
  • 文件大小509.50KB
  • 发表时间1979-05
  • DOI10.2307/1268520
  • 页码229-232
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