海量图书期刊资源,随时随地畅享阅读乐趣
Surface analysis during vapour phase growthF. Hottier; J.B. Theeten · 1980
Very low temperature LEED from Si (III)J.B. Theeten; J. Bonnerot; J.L. Domange; J.P. Hurault · 1971
The determination of interface layers by spectroscopic ellipsometryJ.B. Theeten; D.E. Aspnes · 1979
LEED thermal studies down to very low temperaturesJ.B. Theeten; J.L. Domange; J.P. Hurault · 1973
LEED at 20°K - A compulsory test of theoryJ.B. Theeten; J.L. Domange; J.P. Hurault · 1972
Analysis of ion-implanted GaAs by spectroscopic ellipsometryM. Erman; J.B. Theeten · 1983
Structure of c(2 × 2) overlayers of sulfur on Ni(100)C.B. Duke; N.O. Lipari; G.E. Laramore; J.B. Theeten · 1973