SPIE Proceedings [SPIE 1980 Los Angeles Technical Symposium - Los Angeles (Monday 4 February 1980)] Advances in Focal Plane Technology - InAsSb Hybrid Imager Evaluation
Rode, J. P.; Chan, William S.
- 作者Rode, J. P.; Chan, William S.
- 卷第217卷
- 印刷ISSN0277-786X
- 文件大小4233.93KB
- 发表时间1980
- DOI10.1117/12.958496
- 页码213-217