Linear variations in conductivity with thickness of thin polycrystalline films
C. R. Pichard; C. R. Tellier; A. J. Tosser
- 作者C. R. Pichard; C. R. Tellier; A. J. Tosser
- 卷第15卷
- 期第9期
- 印刷ISSN0022-2461
- 电子ISSN1573-4803
- 文件大小245.44KB
- 发表时间1980-09
- DOI10.1007/bf00552312
- 页码2236-2240