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[IEEE 19th International Reliability Physics Symposium - Las Vegas, NV, USA (1981.04.7-1981.04.9)] 19th International Reliability Physics Symposium - Condensation Thermography - A Novel Approach for Locating Short Circuits and Determing Surface Temperatures in Semiconductor Die

[IEEE 19th International Reliability Physics Symposium - Las Vegas, NV, USA (1981.04.7-1981.04.9)] 19th International Reliability Physics Symposium - Condensation Thermography - A Novel Approach for Locating Short Circuits and Determing Surface Temperatures in Semiconductor Die

DerMarderosian, Aaron; Gionet, Vincent; Caccamesi, Vincent

作者DerMarderosian, Aaron; Gionet, Vincent; Caccamesi, Vincent
文件大小6806.99KB
发表时间1981
DOI10.1109/irps.1981.363009
页码276-281

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