Determination of three parameters of a depth profile of foreign atoms in bulk material using pixe analysis: Part I: Influence of the errors of yield measurements
- 作者M. Geretschlàger
- 卷第200卷
- 印刷ISSN0167-5087
- 文件大小355.63KB
- 发表时间1982
- DOI10.1016/0167-5087(82)90477-x
- 页码505-509
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