![[IEEE 2014 Sixth International Conference on Measuring Technology and Mechatronics Automation (ICMTMA) - Zhangjiajie, China (2014.01.10-2014.01.11)] 2014 Sixth International Conference on Measuring Technology and Mechatronics Automation - Process Reliability Data Comparison Guidance and Practise in Advanced Semiconductor Manufacturing Quality Control]()
[IEEE 2014 Sixth International Conference on Measuring Technology and Mechatronics Automation (ICMTMA) - Zhangjiajie, China (2014.01.10-2014.01.11)] 2014 Sixth International Conference on Measuring Technology and Mechatronics Automation - Process Reliability Data Comparison Guidance and Practise in Advanced Semiconductor Manufacturing Quality ControlWang, Dulin; Kang, Randy; Li, Ming; Ma, Jenny; Wu, Jeff; Chein, Wei-Ting Kary · 2014