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SPIE Proceedings [SPIE 1982 Los Angeles Technical Symposium - Los Angeles (Wednesday 27 January 1982)] Optical Thin Films - <title>Infrared Ellipsometry</title>

SPIE Proceedings [SPIE 1982 Los Angeles Technical Symposium - Los Angeles (Wednesday 27 January 1982)] Optical Thin Films - Infrared Ellipsometry

Leonard, Thomas A.; Stubbs, Jack; Loomis, John S.; Seddon, Richard I.

作者Leonard, Thomas A.; Stubbs, Jack; Loomis, John S.; Seddon, Richard I.
卷第325卷
印刷ISSN0277-786X
文件大小283.33KB
发表时间1982
DOI10.1117/12.933298
页码149-155

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