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Nature of the Defect Determining the Fermi Level Stabilization in Irradiated Silicon

Nature of the Defect Determining the Fermi Level Stabilization in Irradiated Silicon

P. F. Lugakov; T. A. Lukashevich; V. V. Shusha

作者P. F. Lugakov; T. A. Lukashevich; V. V. Shusha
卷第74卷
期第2期
印刷ISSN1862-6319
文件大小560.82KB
发表时间1982
DOI10.1002/pssa.2210740209
页码445-452

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