发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

Investigation of crystal defects in gaas by X-ray topography and SEM transmission cathodoluminescence

Investigation of crystal defects in gaas by X-ray topography and SEM transmission cathodoluminescence

P. Franzosi; G. Salviati
  • 作者P. Franzosi; G. Salviati
  • 卷第9卷
  • 印刷ISSN0254-0584
  • 文件大小481.29KB
  • 发表时间1983
  • DOI10.1016/0254-0584(82)90031-1
  • 页码321-328
← 返回【学霸图书馆】主页