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Relief etching technique for scanning and transmission electron microscopy characterization of submicron precipitates in aluminum alloys

Relief etching technique for scanning and transmission electron microscopy characterization of submicron precipitates in aluminum alloys

J. Howe

作者J. Howe
卷第16卷
期第3期
印刷ISSN0026-0800
文件大小1540.08KB
发表时间1983
DOI10.1016/0026-0800(83)90013-7
页码275-286

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