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Hot electron attenuation in silicon oxideR.D. Gould; C.A. Hogarth; R.A. Collins · 1973
Quantitative analysis of diffraction enhanced imagesS. Crittell; M. Ibison; K.C. Cheung; R. Hodgson; D. Gould; C. Hall; P.J. Nolan; R.D. Page · 2007
Structure and electrical conduction properties of phthalocyanine thin filmsR.D. Gould · 1996
D.C. electrical properties of evaporated thin films of CdTeR.D. Gould; C.J. Bowler · 1988
Trapping distributions in Nd2O3 thin filmsR.D. Gould · 1983
On the Van der Pauw method of resistivity measurementsA.A. Ramadan; R.D. Gould; A. Ashour · 1994
D.C. electrical measurements on evaporated thin films of copper phthalocyanineR.D. Gould · 1985
Comments on “Potential distributions in electroformed MIM and MIMIM structures”R.D. Gould; C.A. Hogarth · 1975