Epidemic and Genetic Models
C. C. Heyde, Richard J. Kryscio, Douglas R. Miller, Simon Tavaré, Warren W. Esty, Colm Art O'Cinneide, R. R. Kocherlakota, Rakesh K. Shukla and R. C. Srivastava
- 期刊名称Advances in Applied Probability
- 作者C. C. Heyde, Richard J. Kryscio, Douglas R. Miller, Simon Tavaré, Warren W. Esty, Colm Art O'Cinneide, R. R. Kocherlakota, Rakesh K. Shukla and R. C. Srivastava
- 卷第16卷
- 期第1期
- 印刷ISSN0001-8678
- 文件大小456.27KB
- 发表时间1984-03
- DOI10.2307/1427222
- 页码26-29