AES and XPS depth profiling certified reference material
- 作者C. P. Hunt; M. T. Anthony; M. P. Seah
- 卷第6卷
- 期第2期
- 印刷ISSN0142-2421
- 电子ISSN1096-9918
- 文件大小152.86KB
- 发表时间1984
- DOI10.1002/sia.740060211
- 页码92-93
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