An XPS and SIMS analysis of biodegradable biomedical polyestersM. C. Davies; R. D. Short; M. A. Khan; J. F. Watts; A. Brown; A. J. Eccles; P. Humphrey; J. C. Vickerman; M. Vert · 1989

The application of secondary Ion mass spectrometry to surface analysis of semiconductor substrates and devicesA. Brown; J. A. van den Berg; J. C. Vickerman · 1986

A comparison of positive and negative ion static SIMS spectra of polymer surfacesA. Brown; J. C. Vickerman · 1986

Comparative studies of constrast mechanisms in electron and ion induced secondary electron imagesA. Brown; D. Briggs; S. Y. Lai; J. C. Vickerman · 1986

Evidence of a charge induced contribution to the sputtering yield of insulating and semiconducting materialsEccles, A. J.; van den Berg, J. A.; Brown, A.; Vickerman, J. C. · Applied Physics Letters · 1986

The relationship between electron and ion induced secondary electron imaging: A review with new experimental observationsS. Y. Lai; A. Brown; J. C. Vickerman; D. Briggs · 1986