Electron distributions at bulk nickel-solid interfaces examined by electron induced X-ray emission spectroscopy
- 作者D. Fargues; F. Vergand; C. Bonnelle
- 卷第163卷
- 文件大小343.15KB
- 发表时间1985
- DOI10.1016/0039-6028(85)91074-x
- 页码489-497
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