Surface strain in GexSi1-x films measured by LEED
- 作者E.G. McRae; R.A. Malic
- 卷第163卷
- 印刷ISSN0167-2584
- 文件大小373.95KB
- 发表时间1985
- DOI10.1016/0167-2584(85)90872-2
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