Ti-Si mixing at room temperature: A high resolution ion backscattering study
- 作者E.J. Van Loenen; A.E.M.J. Fischer; J.F. Van Der Veen
- 卷第155卷
- 期第1期
- 印刷ISSN0167-2584
- 文件大小50.08KB
- 发表时间1985
- DOI10.1016/0167-2584(85)91122-3
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