Photo-Induced Current Transient Spectroscopy in High-Resistivity Bulk Material. III. Scanning-PICTS System for Imaging Spatial Distributions of Deep-Traps in Semi-Insulating GaAs Wafer

• 作者O. Yoshie; M. Kamihara
• 文件大小208.65KB
• 发表时间1985
• DOI10.1143/JJAP.24.431