Sampling Bias and the Inspection Paradox
- 期刊名称Mathematics Magazine
- 作者William E. Stein and Ronald Dattero
- 卷第58卷
- 期第2期
- 印刷ISSN0025-570X
- 电子ISSN1930-0980
- 文件大小480.23KB
- 发表时间1985-03
- DOI10.2307/2689897
- 页码96-99
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