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SPIE Proceedings [SPIE 1984 European Conference on Optics, Optical Systems and Applications - Amsterdam, Netherlands (Tuesday 9 October 1984)] 1984 European Conf on Optics, Optical Systems, and Applications - <title>Measurement Of Reflectivity And Color Of Translucent Materials</title>

SPIE Proceedings [SPIE 1984 European Conference on Optics, Optical Systems and Applications - Amsterdam, Netherlands (Tuesday 9 October 1984)] 1984 European Conf on Optics, Optical Systems, and Applications - Measurement Of Reflectivity And Color Of Translucent Materials

Ten Bosch, J. J.; Borsboom, P. C.; van der Burgt, T.; Kortsmit, W.; Bolger, Bouwe; Ferwerda, Hedzer A.
  • 作者Ten Bosch, J. J.; Borsboom, P. C.; van der Burgt, T.; Kortsmit, W.; Bolger, Bouwe; Ferwerda, Hedzer A.
  • 卷第492卷
  • 印刷ISSN0277-786X
  • 文件大小1862.21KB
  • 发表时间1985
  • DOI10.1117/12.943759
  • 页码493-499
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