MOSFET drain breakdown voltage
- 期刊名称IEEE Electron Device Letters
- 作者Wu-Shiung Feng, ; Chan, T.Y.; Chenming Hu
- 卷第7卷
- 期第7期
- 印刷ISSN0741-3106
- 文件大小216.63KB
- 发表时间1986-07
- DOI10.1109/EDL.1986.26432
- 页码449-450
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