Instrumentation: Powerful microprocessors and standard buses help advance modular card instrumentation; meanwhile bench test equipment gets new features
- 期刊名称IEEE Spectrum
- 作者Voelcker, John; Birnbaum, Joel S.
- 卷第23卷
- 期第1期
- 印刷ISSN0018-9235
- 文件大小1731.02KB
- 发表时间1986
- DOI10.1109/mspec.1986.6370965
- 页码57-60
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