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Dislocations in high-purity germanium and its relation to γ-ray detector performance

Dislocations in high-purity germanium and its relation to γ-ray detector performance

M. Van Sande; L. Van Goethem; L. De Laet; H. Guislain
  • 作者M. Van Sande; L. Van Goethem; L. De Laet; H. Guislain
  • 卷第40卷
  • 期第4期
  • 印刷ISSN0947-8396
  • 电子ISSN1432-0630
  • 文件大小577.51KB
  • 发表时间1986-08
  • DOI10.1007/bf00616604
  • 页码257-261
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