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Rheed studies and interface analysis of GaAs grown on Si(001)

Rheed studies and interface analysis of GaAs grown on Si(001)

K. Woodbridge; J.P. Gowers; P.F. Fewster; J.H. Neave; B.A. Joyce

作者K. Woodbridge; J.P. Gowers; P.F. Fewster; J.H. Neave; B.A. Joyce
卷第81卷
印刷ISSN0022-0248
文件大小184.57KB
发表时间1987
DOI10.1016/0022-0248(87)90395-2
页码224-225

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