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[ACM Press 24th ACM/IEEE conference proceedings - Miami Beach, Florida, United States (1987.06.28-1987.07.01)] 24th ACM/IEEE conference proceedings on Design automation conference - DAC '87 - Realistic fault modeling for VLSI testing

[ACM Press 24th ACM/IEEE conference proceedings - Miami Beach, Florida, United States (1987.06.28-1987.07.01)] 24th ACM/IEEE conference proceedings on Design automation conference - DAC '87 - Realistic fault modeling for VLSI testing

Maly, W.

作者Maly, W.
文件大小1890.49KB
发表时间1987
DOI10.1145/37888.37914
页码173-180

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