[IEEE Eleventh IEEE European Test Symposium (ETS'06) - Southampton, UK (21-21 May 2006)] Eleventh IEEE European Test Symposium (ETS'06) - A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF ApplicationsCimino, M.; Lapuyade, H.; De Matos, M.; Taris, T.; Deval, Y.; Begueret, J.B. · 2006