Xerographic-mode transient charge technique for probing drift mobility in high-resistivity materials†
CHAN, ARCHIE Y. C.; JUHASZ, C.
- 期刊名称International Journal of Electronics
- 作者CHAN, ARCHIE Y. C.; JUHASZ, C.
- 卷第62卷
- 期第4期
- 印刷ISSN0020-7217
- 电子ISSN1362-3060
- 文件大小255.60KB
- 发表时间1987-04
- DOI10.1080/00207218708921013
- 页码625-632